Paper
17 May 2011 Dual-probe simultaneous measurements of refractive index and thickness with spectral-domain low coherence interferometry
Author Affiliations +
Proceedings Volume 7753, 21st International Conference on Optical Fiber Sensors; 77531N (2011) https://doi.org/10.1117/12.885173
Event: 21st International Conference on Optical Fibre Sensors (OFS21), 2011, Ottawa, Canada
Abstract
An optical interferometric system for the simultaneous measurements of physical thickness and refractive group index is implemented. The proposed system is based on a spectral-domain optical low coherence interferometry with two sample probes facing to each other. The two-probe approach enables simultaneous measurements of thickness and group index of a transparent sample. The average measurement errors were ~0.112 % in the physical thickness and ~0.035 % in the group index, respectively.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seong Jun Park, Kwan Seob park, Young Ho Kim, Se-Jong Baik, and Byeong Ha Lee "Dual-probe simultaneous measurements of refractive index and thickness with spectral-domain low coherence interferometry", Proc. SPIE 7753, 21st International Conference on Optical Fiber Sensors, 77531N (17 May 2011); https://doi.org/10.1117/12.885173
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Cited by 2 scholarly publications.
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KEYWORDS
Interferometry

Fourier transforms

Refractive index

Coherence (optics)

Glasses

Interferometers

Optical testing

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