10 September 2010 Propagation of a Gaussian beam through a stack of positive and negative refractive index materials
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Abstract
Propagation of a monochromatic Gaussian beam through a stack of alternating layers of positive-refractive-index dielectrics and negative-refractive-index metamaterials is analyzed using paraxial ray-optics approach. Expressions for the change of the spot-size of the Gaussian beam are derived. Sensors for measuring parameters that affect the thickness or refractive index of the metamaterials can be developed based on the change of the spot-size.
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Anjan Ghosh, Anjan Ghosh, Pramode Verma, Pramode Verma, Partha P. Banerjee, Partha P. Banerjee, Rola Aylo, Rola Aylo, } "Propagation of a Gaussian beam through a stack of positive and negative refractive index materials", Proc. SPIE 7754, Metamaterials: Fundamentals and Applications III, 775415 (10 September 2010); doi: 10.1117/12.861948; https://doi.org/10.1117/12.861948
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