19 August 2010 Analysis of the glass-clear PVB lamination foil interface of thin film laminates
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Proceedings Volume 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III; 77730B (2010); doi: 10.1117/12.855503
Event: SPIE Solar Energy + Technology, 2010, San Diego, California, United States
Abstract
Systematic investigation of aging mechanisms of a glass-clear PVB film interface at the edge of thin film silicon photovoltaic modules has been performed. The modules under study were composed of a front superstrate laminated to a back glass. Different degradation mechanisms responsible for adhesive strengths loss between PVB film and superstrate are discussed. Glass-foil adhesive strength in compressive shear configuration using different glass compositions and module configurations is given. As accelerated aging stress of the modules, standard damp heat test conditions (85° C, 85% relative humidity) have been applied. A chemical analysis of the glass foil interface was performed and the correlation of those results to those coming from wet leakage measurements is also given.
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Jens Günster, Stefan Krull, Fabia Rakusa, Florian Roth, Ivan Sinicco, "Analysis of the glass-clear PVB lamination foil interface of thin film laminates", Proc. SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, 77730B (19 August 2010); doi: 10.1117/12.855503; https://doi.org/10.1117/12.855503
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KEYWORDS
Glasses

Interfaces

Silica

Heat treatments

Chemical analysis

Ions

Thin films

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