19 August 2010 Glass-encapsulant interface characterization following temperature and humidity exposure
Author Affiliations +
Abstract
The ability to optimize and consistently control the properties of the polymer-glass interface in thin film PV laminates in an important aspect of module reliability. Using variable rate peel delamination methods developed to isolate the encapsulant/glass interface, ion migration and interfacial chemistry have been studied following temperature and humidity exposure. In this presentation we will review quantitative AFM (Atomic Force Microscopy) and XPS (X-ray Photoelectron Spectroscopy) analyses linking failure modes with interfacial chemistry.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Katherine Stika, Katherine Stika, Rebecca Smith, Rebecca Smith, Dennis Swartzfager, Dennis Swartzfager, Donald Huang, Donald Huang, Diane Davidson, Diane Davidson, James Marsh, James Marsh, Robert Agostinelli, Robert Agostinelli, John Wyre, John Wyre, Donald Brill, Donald Brill, Roger Senigo, Roger Senigo, } "Glass-encapsulant interface characterization following temperature and humidity exposure", Proc. SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, 777311 (19 August 2010); doi: 10.1117/12.860865; https://doi.org/10.1117/12.860865
PROCEEDINGS
6 PAGES


SHARE
Back to Top