8 September 2010 Deterministic sequential stray light analysis
Author Affiliations +
Proceedings Volume 7794, Optical System Contamination: Effects, Measurements, and Control 2010; 77940T (2010); doi: 10.1117/12.860861
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States
Non-sequential ray tracing for stray light analyses have demonstrated value, but are over-constrained when high sampling and speed are both needed. In cases where real geometry and mechanical surface properties are critical, such analyses are certainly required. But the goal of these analyses is often to attempt to approach the performance that would be achieved if only the optics contributed scatter and only through the sequential optical path. In other words, optical element scatter is the limiting case for system performance. An analysis technique is therefore presented that enables approximate but rapid sequential stray light estimates through deterministic modeling. Results of correlation to nonsequential analyses demonstrate the large range of applicability of this approach. Examples of parametric studies show the value of rapid paraxial estimates for understanding system performance sensitivities.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael G. Dittman, Eric Donley, Frank Grochocki, "Deterministic sequential stray light analysis", Proc. SPIE 7794, Optical System Contamination: Effects, Measurements, and Control 2010, 77940T (8 September 2010); doi: 10.1117/12.860861; https://doi.org/10.1117/12.860861

Stray light


Stray light analysis


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