Paper
7 September 2010 The development of an automatic scanning path generation method for the spinneret test
Chun-Jen Chen, Min-Wei Hung, Wenyuh Jywe, Donyau Chiang
Author Affiliations +
Abstract
An automatic scanning path generation method is developed. The method is based on a 3-axis automatic inspection system which is used to detect the clearance ratio of spinneret plate. The user can rely on this method to automatically generate the scanning path for an unknown spinneret plate in the spinneret test. Then the scanning path can be learned by the inspection system and repeated it for other the same spinneret. Two type spinnerets are introduced in this paper to describe the automatic scanning path generation method. In this paper, the 3-axis automatic inspection system includes a 3-axes motorized linear stage, a telcentric lens, a top light source, a bottom light source, 1 CCD camera and a controlled PC.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chun-Jen Chen, Min-Wei Hung, Wenyuh Jywe, and Donyau Chiang "The development of an automatic scanning path generation method for the spinneret test", Proc. SPIE 7798, Applications of Digital Image Processing XXXIII, 779820 (7 September 2010); https://doi.org/10.1117/12.859237
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Inspection

Capillaries

Light sources

CCD cameras

Light emitting diodes

Image segmentation

Imaging systems

Back to Top