11 May 1987 An Investigation Into The Factors Affecting Infrared Temperature Measurements For Building Applications
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Abstract
Various factors affecting infrared temperature measurements are discussed. Temperature calibration curves at surrounding temperatures between -20°C and 25°C are presented for two infrared imaging systems operating in the 2 to 5 μm and 8 to 14 μm wavelength regions. The calibration curves for the 2 to 5 μm system were found to be independent to surrounding temperatures, while the calibration curves for the 8 to 14 μm system were found to be strongly dependent to surrounding temperatures. Equations to account for changes in surrounding temperatures are presented. Laboratory measurements of emissivity using both systems at different surrounding temperatures (22°C, 4°C, and -11°C) are given for several typical building materials. The emissivity measurements are used in computing surface temperatures of the materials. Comparisons are made between predicted and measured surface temperatures.
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Y. May Chang, "An Investigation Into The Factors Affecting Infrared Temperature Measurements For Building Applications", Proc. SPIE 0780, Thermosense IX: Thermal Infrared Sensing for Diagnostics and Control, (11 May 1987); doi: 10.1117/12.940486; https://doi.org/10.1117/12.940486
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KEYWORDS
Temperature metrology

Infrared imaging

Calibration

Imaging systems

Infrared radiation

Black bodies

Environmental sensing

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