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Present status of upgraded long trace profiler for characterization of high-precision x-ray mirrors at SPring-8
Recent upgrades to the Diamond-NOM: A slope measuring profiler capable of characterizing the surface profile of large optics with sub-nanometer repeatability
A double-pass Fizeau interferometer system for measuring the figure error of large synchrotron optics
Calibration of the modulation transfer function of surface profilometers with binary pseudo-random test standards: expanding the application range
Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer