Paper
27 August 2010 Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation
F. Frassetto, S. Coraggia, L. Poletto, N. Guerassimova, S. Dziarzhytski, E. Ploenjes, H. Weigelt
Author Affiliations +
Abstract
We present the design and characterization of the spectrometer to be used at the FLASH facility (DESY, Hamburg) to characterize the spectral properties of free-electron-laser radiation in terms of high harmonics content. The spectrometer is sensitive in the 2-40 nm region. The optical design consists of two spherical gratings with variable groove spacing and a extreme-ultraviolet-enhanced CCD detector. The instrument design and characterization are presented.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Frassetto, S. Coraggia, L. Poletto, N. Guerassimova, S. Dziarzhytski, E. Ploenjes, and H. Weigelt "Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation", Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 780209 (27 August 2010); https://doi.org/10.1117/12.861615
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Cited by 4 scholarly publications.
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KEYWORDS
Spectroscopy

Sensors

Free electron lasers

Extreme ultraviolet

Charge-coupled devices

CCD image sensors

Optical design

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