27 August 2010 Investigation of aberrations of Kirkpatrick-Baez mirrors
Author Affiliations +
The flux distributions in the focal plane of Kirkpatrick-Baez optics are investigated as the parameters of the focusing ellipse of the mirrors are changed from typical laboratory optics to synchrotron beam line optics. This work shows the effects of the most predominant focusing imperfections that arise from conditions that violate the original assumptions of Kirkpatrick-Baez systems, including orthogonality of the mirror surfaces and paraxial rays.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bodo Ehlers, Bodo Ehlers, Boris Verman, Boris Verman, } "Investigation of aberrations of Kirkpatrick-Baez mirrors", Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 78020F (27 August 2010); doi: 10.1117/12.859850; https://doi.org/10.1117/12.859850


Laterally graded multilayer optics for x-ray analysis
Proceedings of SPIE (November 23 1999)
Recent advances in x-ray source/optic integration
Proceedings of SPIE (November 02 2000)
X-ray fluorescence analysis based on Kumakhov optics
Proceedings of SPIE (November 19 1998)
Polycapillary optics for powder diffraction
Proceedings of SPIE (December 06 2001)
Multilayer x ray optics for energies E > 8 keV...
Proceedings of SPIE (November 02 2000)

Back to Top