2 September 2010 High-resolution x-ray phase tomography
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Abstract
X-ray tomography is a workhorse tool of non-destructive imaging. It is used to probe three-dimensional structures across a wide range of length scales for objects that offer good absorption contrast to x-rays. In recent years extremely high resolution imaging (on the order of tens of nanometres) has become possible due to technological advances in x-ray optics. At the same time the requirement for strong absorption contrast has been relaxed thanks to the advent of new experimental and algorithmic techniques in phase imaging. Advances in both resolution and phase imaging can be combined to image biological samples at the sub-cellular level. I will report on recent advances in our work including improvements to the current approaches in extracting phase information at high resolution from measurements of the diffracted intensity from a sample. I will also discuss our current experimental status.
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Andrew G. Peele, Andrew G. Peele, C. David L. Thomas, C. David L. Thomas, John G. Clement, John G. Clement, Benedicta D. Arhatari, Benedicta D. Arhatari, Kevin M. Hannah, Kevin M. Hannah, Chandni Doshi, Chandni Doshi, Corey T. Putkunz, Corey T. Putkunz, Jesse N. Clark, Jesse N. Clark, } "High-resolution x-ray phase tomography", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 780403 (2 September 2010); doi: 10.1117/12.862177; https://doi.org/10.1117/12.862177
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