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1 September 2010 Data-constrained microstructure modeling with multi-spectrum x-ray CT
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Abstract
Conventional X-ray CT is not usually sufficient to determine microscopic compositional distributions. A dataconstrained microstructure modeling (DCM) methodology has been developed which uses multiple CT data sets acquired with different X-ray spectra, and incorporates them as model constraints. The DCM approach has been applied to predict the distributions of corrosion inhibitor and filler in a polymer matrix. The DCM-predicted compositional microstructures have a reasonable agreement with EDX images taken on the sample surface.
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Y. S. Yang, A. M. Tulloh, T. Muster, A. Trinchi, S. C. Mayo, and S. W. Wilkins "Data-constrained microstructure modeling with multi-spectrum x-ray CT", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040N (1 September 2010); doi: 10.1117/12.861964; https://doi.org/10.1117/12.861964
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