1 September 2010 X-ray nanotomography in a SEM
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Abstract
We have developed an x-ray computer tomography (CT) add-on to perform X-ray micro- and nanotomography in any scanning electron microscope (SEM). The electron beam inside the SEM is focused on a metal target to generate x-rays. Part of the X-rays pass through the object that is installed on a rotation stage. Shadow X-ray images are collected by a CCD camera with direct photon detection mounted on the external wall of the SEM specimen chamber. An extensive description on the working principles of this micro/nano-CT add-on together with some examples of CT-scans will be given in this paper. The resolution that can be obtained with this set-up and the influence of the shape of the electron beam are discussed. Furthermore, possible improvements on this SEM-CT set-up will be discussed: replacing the backilluminated CCD with a fully depleted CCD with improved quantum efficiency (QE) for higher energies, reduces the exposure time by 6 when using metal targets with x-ray characteristic lines around 10 keV.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bart Pauwels, Bart Pauwels, Xuan Liu, Xuan Liu, Alexander Sasov, Alexander Sasov, } "X-ray nanotomography in a SEM", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040S (1 September 2010); doi: 10.1117/12.860201; https://doi.org/10.1117/12.860201
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