3 September 2010 Key components for artifact-free micro-CT and nano-CT instruments
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Proceedings Volume 7804, Developments in X-Ray Tomography VII; 78040U (2010); doi: 10.1117/12.860380
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States
Abstract
Proper selection of modern key components allows eliminating most artifacts in micro-CT and nano-CT systems already during data acquisition. X-ray cameras with direct photon detection allow avoiding ring artifacts. Newly developed fully depleted CCD sensors show an energy response similar to traditional cameras with a thin scintillator, but without any geometrical distortions and flashes from x-ray photons penetrating through the fiber optics. Air-bearing rotation stages and piezo-positioning minimizes mechanical inaccuracies in acquiring angular projections. Beam hardening can be eliminated by energy-selective photon counting imaging.
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Alexander Sasov, Bart Pauwels, Xuan Liu, Peter Bruyndonckx, "Key components for artifact-free micro-CT and nano-CT instruments", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040U (3 September 2010); doi: 10.1117/12.860380; https://doi.org/10.1117/12.860380
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KEYWORDS
X-rays

Cameras

Charge-coupled devices

Scintillators

Scanners

Sensors

CCD cameras

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