2 September 2010 Key components for artifact-free micro-CT and nano-CT instruments
Author Affiliations +
Abstract
Proper selection of modern key components allows eliminating most artifacts in micro-CT and nano-CT systems already during data acquisition. X-ray cameras with direct photon detection allow avoiding ring artifacts. Newly developed fully depleted CCD sensors show an energy response similar to traditional cameras with a thin scintillator, but without any geometrical distortions and flashes from x-ray photons penetrating through the fiber optics. Air-bearing rotation stages and piezo-positioning minimizes mechanical inaccuracies in acquiring angular projections. Beam hardening can be eliminated by energy-selective photon counting imaging.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Sasov, Bart Pauwels, Xuan Liu, Peter Bruyndonckx, "Key components for artifact-free micro-CT and nano-CT instruments", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040U (2 September 2010); doi: 10.1117/12.860380; https://doi.org/10.1117/12.860380
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

Design and development of a fiber optic TDI CCD based...
Proceedings of SPIE (December 16 1993)
CCD-based detector for x-ray crystallography
Proceedings of SPIE (July 12 1994)
PN CCD detector for the European photon imaging camera on...
Proceedings of SPIE (October 31 1996)
Soft X-Ray Image Detection
Proceedings of SPIE (November 27 1989)

Back to Top