Single photon emission and detection at the nanoscale utilizing semiconductor nanowires

Michael E. Reimer; Maarten P. van Kouwen; Maria Barkelid; Moïra Hocevar; Maarten H. M. van Weert; Rienk E. Algra; Erik P. A. M. Bakkers; Mikael T. Björk; Heinz Schmid; Heike Riel; Leo P. Kouwenhoven; Val Zwiller

doi:10.1117/12.868961

20 September 2010 Single photon emission and detection at the nanoscale utilizing semiconductor nanowires

Michael E. Reimer, Maarten P. van Kouwen, Maria Barkelid, Moïra Hocevar, Maarten H. M. van Weert, Rienk E. Algra, Erik P. A. M. Bakkers, Mikael T. Björk, Heinz Schmid, Heike Riel, Leo P. Kouwenhoven, Val Zwiller

Author Affiliations +

Proceedings Volume 7808, Infrared Remote Sensing and Instrumentation XVIII; 780809 (2010) https://doi.org/10.1117/12.868961
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

We report recent progress toward on-chip single photon emission and detection in the near infrared utilizing semiconductor nanowires. Our single photon emitter is based on a single InAsP quantum dot embedded in a p-n junction defined along the growth axis of an InP nanowire. Under forward bias, light is emitted from the single quantum dot by electrical injection of electrons and holes. The optical quality of the quantum dot emission is shown to improve when surrounding the dot material by a small intrinsic section of InP. Finally, we report large multiplication factors in excess of 1000 from a single Si nanowire avalanche photodiode comprised of p-doped, intrinsic, and n-doped sections. The large multiplication factor obtained from a single Si nanowire opens up the possibility to detect a single photon at the nanoscale.

Citation Download Citation

Michael E. Reimer, Maarten P. van Kouwen, Maria Barkelid, Moïra Hocevar, Maarten H. M. van Weert, Rienk E. Algra, Erik P. A. M. Bakkers, Mikael T. Björk, Heinz Schmid, Heike Riel, Leo P. Kouwenhoven, and Val Zwiller "Single photon emission and detection at the nanoscale utilizing semiconductor nanowires", Proc. SPIE 7808, Infrared Remote Sensing and Instrumentation XVIII, 780809 (20 September 2010); https://doi.org/10.1117/12.868961

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available