30 August 2010 Study on noise reduction in up-conversion single photon detectors
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Proceedings Volume 7815, Quantum Communications and Quantum Imaging VIII; 781508 (2010); doi: 10.1117/12.859272
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States
Abstract
Up-conversion single photon detector technology has become efficient for photons in the near infrared range. However, its dark count rate is a major concern for some applications in quantum optics. We have theoretically and experimentally studied the causes of dark counts, and developed an up-conversion detector with an ultra low dark count rate. A reduced dark count rate of only 320 counts per second is achieved at the maximum overall detection efficiency of 18% and a dark count rate of less than 100 counts per second is achieved at a detection efficiency of 10%. The ultra low dark count rate enables this type of up-conversion detector to be utilized in a variety of applications where weak signals in the near IR region are only at a level of few thousand photons per second.
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Lijun Ma, Oliver Slattery, Xiao Tang, "Study on noise reduction in up-conversion single photon detectors", Proc. SPIE 7815, Quantum Communications and Quantum Imaging VIII, 781508 (30 August 2010); doi: 10.1117/12.859272; https://doi.org/10.1117/12.859272
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KEYWORDS
Photons

Sensors

Waveguides

Avalanche photodetectors

Single photon detectors

Raman scattering

Raman spectroscopy

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