PROCEEDINGS VOLUME 7820
INTERNATIONAL CONFERENCE ON IMAGE PROCESSING AND PATTERN RECOGNITION IN INDUSTRIAL ENGINEERING | 7-8 AUGUST 2010
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
INTERNATIONAL CONFERENCE ON IMAGE PROCESSING AND PATTERN RECOGNITION IN INDUSTRIAL ENGINEERING
7-8 August 2010
Xi'an, China
Front Matter: Volume 7820
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782001 (19 August 2010); doi: 10.1117/12.870032
Image Acquisition and Processing, Pattern Recognition, and Computer Vision in Industrial Engineering
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782002 (18 August 2010); doi: 10.1117/12.867102
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782003 (19 August 2010); doi: 10.1117/12.867103
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782004 (19 August 2010); doi: 10.1117/12.867104
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782005 (19 August 2010); doi: 10.1117/12.867130
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782006 (19 August 2010); doi: 10.1117/12.867227
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782007 (19 August 2010); doi: 10.1117/12.867250
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782008 (19 August 2010); doi: 10.1117/12.867261
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782009 (19 August 2010); doi: 10.1117/12.867442
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200A (19 August 2010); doi: 10.1117/12.867444
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200B (19 August 2010); doi: 10.1117/12.867445
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200C (19 August 2010); doi: 10.1117/12.867450
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200D (19 August 2010); doi: 10.1117/12.867454
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200E (19 August 2010); doi: 10.1117/12.867456
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200F (19 August 2010); doi: 10.1117/12.867457
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200G (19 August 2010); doi: 10.1117/12.867458
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200H (19 August 2010); doi: 10.1117/12.866262
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200I (19 August 2010); doi: 10.1117/12.867460
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200J (19 August 2010); doi: 10.1117/12.867462
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200K (19 August 2010); doi: 10.1117/12.867463
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200L (19 August 2010); doi: 10.1117/12.867467
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200M (19 August 2010); doi: 10.1117/12.867477
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200N (19 August 2010); doi: 10.1117/12.866337
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200O (19 August 2010); doi: 10.1117/12.867483
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200P (19 August 2010); doi: 10.1117/12.867484
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200Q (19 August 2010); doi: 10.1117/12.867494
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200R (19 August 2010); doi: 10.1117/12.867496
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200S (19 August 2010); doi: 10.1117/12.867502
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200T (20 August 2010); doi: 10.1117/12.867504
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200U (20 August 2010); doi: 10.1117/12.867508
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200V (20 August 2010); doi: 10.1117/12.867513
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200W (20 August 2010); doi: 10.1117/12.866368
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200X (20 August 2010); doi: 10.1117/12.867526
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200Y (20 August 2010); doi: 10.1117/12.867581
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200Z (20 August 2010); doi: 10.1117/12.867580
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782010 (20 August 2010); doi: 10.1117/12.867584
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782011 (20 August 2010); doi: 10.1117/12.867587
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782012 (20 August 2010); doi: 10.1117/12.867619
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782013 (20 August 2010); doi: 10.1117/12.867631
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782014 (20 August 2010); doi: 10.1117/12.866384
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782015 (20 August 2010); doi: 10.1117/12.866405
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782016 (20 August 2010); doi: 10.1117/12.866424
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782017 (20 August 2010); doi: 10.1117/12.866049
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782018 (20 August 2010); doi: 10.1117/12.866472
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782019 (20 August 2010); doi: 10.1117/12.866476
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201A (20 August 2010); doi: 10.1117/12.866485
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201B (20 August 2010); doi: 10.1117/12.866605
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201C (20 August 2010); doi: 10.1117/12.866609
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201D (20 August 2010); doi: 10.1117/12.866625
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201E (20 August 2010); doi: 10.1117/12.866631
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201F (20 August 2010); doi: 10.1117/12.866077
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201G (20 August 2010); doi: 10.1117/12.866634
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201H (20 August 2010); doi: 10.1117/12.866650
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201I (20 August 2010); doi: 10.1117/12.866667
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201J (20 August 2010); doi: 10.1117/12.866668
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201K (20 August 2010); doi: 10.1117/12.866688
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201L (20 August 2010); doi: 10.1117/12.866702
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201M (20 August 2010); doi: 10.1117/12.866706
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201N (20 August 2010); doi: 10.1117/12.866149
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201O (20 August 2010); doi: 10.1117/12.866715
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201P (20 August 2010); doi: 10.1117/12.866716
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201Q (20 August 2010); doi: 10.1117/12.866719
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201R (20 August 2010); doi: 10.1117/12.866727
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201S (20 August 2010); doi: 10.1117/12.866729
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201T (20 August 2010); doi: 10.1117/12.866734
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201U (20 August 2010); doi: 10.1117/12.866207
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201V (20 August 2010); doi: 10.1117/12.866737
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201W (20 August 2010); doi: 10.1117/12.866741
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201X (20 August 2010); doi: 10.1117/12.866746
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201Y (20 August 2010); doi: 10.1117/12.866752
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201Z (20 August 2010); doi: 10.1117/12.866756
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782020 (20 August 2010); doi: 10.1117/12.866760
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782021 (20 August 2010); doi: 10.1117/12.866763
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782022 (20 August 2010); doi: 10.1117/12.866765
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782023 (20 August 2010); doi: 10.1117/12.866821
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782024 (20 August 2010); doi: 10.1117/12.866827
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782025 (20 August 2010); doi: 10.1117/12.866838
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782026 (20 August 2010); doi: 10.1117/12.866867
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782027 (20 August 2010); doi: 10.1117/12.866918
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782028 (20 August 2010); doi: 10.1117/12.866932
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782029 (20 August 2010); doi: 10.1117/12.866934
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202A (20 August 2010); doi: 10.1117/12.866935
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202B (20 August 2010); doi: 10.1117/12.866948
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202C (20 August 2010); doi: 10.1117/12.866954
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202D (20 August 2010); doi: 10.1117/12.866958
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202E (20 August 2010); doi: 10.1117/12.866962
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202F (20 August 2010); doi: 10.1117/12.866964
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202G (20 August 2010); doi: 10.1117/12.866973
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202H (20 August 2010); doi: 10.1117/12.866975
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202I (20 August 2010); doi: 10.1117/12.866980
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202J (20 August 2010); doi: 10.1117/12.866982
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202K (20 August 2010); doi: 10.1117/12.866219
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202L (20 August 2010); doi: 10.1117/12.866983
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202M (20 August 2010); doi: 10.1117/12.867026
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202N (20 August 2010); doi: 10.1117/12.867033
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202O (20 August 2010); doi: 10.1117/12.867039
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202P (20 August 2010); doi: 10.1117/12.867045
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202Q (20 August 2010); doi: 10.1117/12.867052
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202R (20 August 2010); doi: 10.1117/12.866231
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202S (20 August 2010); doi: 10.1117/12.867078
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202T (20 August 2010); doi: 10.1117/12.867085
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202U (20 August 2010); doi: 10.1117/12.867099
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202V (20 August 2010); doi: 10.1117/12.867100
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202W (20 August 2010); doi: 10.1117/12.867516
GIS, GPS, RS, & Wireless and Optical Communications in Industrial Engineering
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202X (20 August 2010); doi: 10.1117/12.866183
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202Y (20 August 2010); doi: 10.1117/12.866653
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202Z (20 August 2010); doi: 10.1117/12.866725
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782030 (20 August 2010); doi: 10.1117/12.866732
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782031 (20 August 2010); doi: 10.1117/12.866743
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782032 (20 August 2010); doi: 10.1117/12.866657
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782033 (20 August 2010); doi: 10.1117/12.866953
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782034 (20 August 2010); doi: 10.1117/12.867024
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782035 (20 August 2010); doi: 10.1117/12.867041
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782036 (20 August 2010); doi: 10.1117/12.866229
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782037 (20 August 2010); doi: 10.1117/12.867043
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782038 (20 August 2010); doi: 10.1117/12.867204
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782039 (20 August 2010); doi: 10.1117/12.867608
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203A (20 August 2010); doi: 10.1117/12.867453
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203B (20 August 2010); doi: 10.1117/12.867459
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203C (20 August 2010); doi: 10.1117/12.867491
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203D (20 August 2010); doi: 10.1117/12.867585
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203E (20 August 2010); doi: 10.1117/12.866308
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203F (20 August 2010); doi: 10.1117/12.866478
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203G (20 August 2010); doi: 10.1117/12.866486
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203H (20 August 2010); doi: 10.1117/12.866629
Industrial Decision Support and Simulation Systems, Sensor Technology, and Intelligent Monitoring and Control/ICT Applications
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203I (20 August 2010); doi: 10.1117/12.866721
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203J (20 August 2010); doi: 10.1117/12.866733
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203K (20 August 2010); doi: 10.1117/12.866812
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203L (20 August 2010); doi: 10.1117/12.866818
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203M (20 August 2010); doi: 10.1117/12.866837
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203N (20 August 2010); doi: 10.1117/12.866839
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203O (20 August 2010); doi: 10.1117/12.866853
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203P (20 August 2010); doi: 10.1117/12.866984
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203Q (20 August 2010); doi: 10.1117/12.867201
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203R (20 August 2010); doi: 10.1117/12.867211