19 August 2010 Front Matter: Volume 7820
Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 782001 (2010) https://doi.org/10.1117/12.870032
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 7820, including the Title Page, Copyright information, Table of Contents, Introduction and the Conference Committee listing.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 7820", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782001 (19 August 2010); doi: 10.1117/12.870032; https://doi.org/10.1117/12.870032
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