19 August 2010 Edge detection based on multi-scale wavelet
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Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 78200G (2010) https://doi.org/10.1117/12.867458
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China
Abstract
In this paper, we present a novel wavelet-based algorithm for multi-scale edge detection. Firstly, calculate wavelet transform coefficients of the image according to the direction of the gradient. Then scan the neighborhood of the corresponding wavelet transform coefficients separately at three-scales, in order to position edges at a small scale and suppress noise at a large scale. The simulation results show that the new algorithm is feasible and effective, more details can be detected. Image clarity handled with new wavelet edge detection algorithm is superior to that of the best currently with Canny operator. For different input image, the novel algorithm can make us get a better edge map.
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Tingwan Wu, Tingwan Wu, Yihui Duan, Yihui Duan, Baoliang Liu, Baoliang Liu, } "Edge detection based on multi-scale wavelet", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200G (19 August 2010); doi: 10.1117/12.867458; https://doi.org/10.1117/12.867458
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