20 August 2010 A combination strategy for tracking the serial criminal
Author Affiliations +
Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 78203C (2010) https://doi.org/10.1117/12.867491
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China
Abstract
We build a Geographic Profiling Model to generate the criminal's geographical profile, by combining two complementary strategies: the Spatial Distribution Strategy and the Probability Distance Strategy. In the first strategy, we designate the mean of all the known crime sites as the anchor point, and build a Standard Deviational Ellipse Model, considering the effect of landscape. In the second strategy, we take many factors such as the buffer zone and distance decay theory into consideration and calculate the probability of the offender's residence in a certain area by using the Bayesian Theorem and the Rossmo Algorithm. Then, we combine the result of two strategies and get three search areas suit different conditions of the police to track the serial criminal. Apply the model to the English serial killer Peter Sutcliffe's case, the calculation result shows that the model can effectively be used to track serial criminal.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chuan He, Chuan He, Yuan-Biao Zhang, Yuan-Biao Zhang, Jiadi Wan, Jiadi Wan, Wenjing Yu, Wenjing Yu, } "A combination strategy for tracking the serial criminal", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203C (20 August 2010); doi: 10.1117/12.867491; https://doi.org/10.1117/12.867491
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

The ontology model of frontCRM framework
Proceedings of SPIE (March 19 2013)
AWM: Adaptive Weight Matting for medical image segmentation
Proceedings of SPIE (February 23 2017)
Parametric curve approximation using ICP reparametrization
Proceedings of SPIE (September 24 2001)
Fast Algorithm For Pattern Recognition Using Test Theory
Proceedings of SPIE (January 17 1988)
A new method for simplification of discernibility function
Proceedings of SPIE (August 20 2010)

Back to Top