PROCEEDINGS VOLUME 7821
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES | 26-29 AUGUST 2010
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES
26-29 August 2010
Constanta, Romania
Front Matter: Volume 7821
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782101 (21 December 2010); doi: 10.1117/12.884716
Plenary Session
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782102 (4 December 2010); doi: 10.1117/12.881595
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782103 (4 December 2010); doi: 10.1117/12.882138
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782104 (4 December 2010); doi: 10.1117/12.882268
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782105 (4 December 2010); doi: 10.1117/12.882393
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782106 (4 December 2010); doi: 10.1117/12.882069
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782107 (4 December 2010); doi: 10.1117/12.881695
Advanced Materials and New Technologies
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782108 (4 December 2010); doi: 10.1117/12.882159
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782109 (4 December 2010); doi: 10.1117/12.882071
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210A (4 December 2010); doi: 10.1117/12.882051
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210B (4 December 2010); doi: 10.1117/12.882148
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210C (4 December 2010); doi: 10.1117/12.882279
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210D (4 December 2010); doi: 10.1117/12.882281
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210E (4 December 2010); doi: 10.1117/12.882299
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210F (4 December 2010); doi: 10.1117/12.882031
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210G (4 December 2010); doi: 10.1117/12.882105
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210H (4 December 2010); doi: 10.1117/12.882397
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210I (4 December 2010); doi: 10.1117/12.881684
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210J (4 December 2010); doi: 10.1117/12.883788
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210K (4 December 2010); doi: 10.1117/12.881773
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210L (4 December 2010); doi: 10.1117/12.882150
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210M (4 December 2010); doi: 10.1117/12.882909
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210N (4 December 2010); doi: 10.1117/12.881776
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210O (4 December 2010); doi: 10.1117/12.881775
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210P (4 December 2010); doi: 10.1117/12.882380
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210Q (4 December 2010); doi: 10.1117/12.881683
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210R (4 December 2010); doi: 10.1117/12.883018
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210S (4 December 2010); doi: 10.1117/12.882295
Diffractive, Micro-optics, and Optical Signal Processing
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210T (4 December 2010); doi: 10.1117/12.881696
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210U (4 December 2010); doi: 10.1117/12.882298
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210V (4 December 2010); doi: 10.1117/12.881812
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210W (4 December 2010); doi: 10.1117/12.881814
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210X (4 December 2010); doi: 10.1117/12.882270
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210Y (4 December 2010); doi: 10.1117/12.882271
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210Z (4 December 2010); doi: 10.1117/12.882569
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782110 (4 December 2010); doi: 10.1117/12.881813
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782111 (4 December 2010); doi: 10.1117/12.882570
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782112 (4 December 2010); doi: 10.1117/12.882084
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782113 (4 December 2010); doi: 10.1117/12.882087
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782114 (4 December 2010); doi: 10.1117/12.882140
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782115 (4 December 2010); doi: 10.1117/12.885002
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782116 (4 December 2010); doi: 10.1117/12.882372
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782117 (7 December 2010); doi: 10.1117/12.885006
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782118 (7 December 2010); doi: 10.1117/12.882112
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782119 (7 December 2010); doi: 10.1117/12.882115
Nanoscience/Nanoengineering and Nanotechnologies
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211A (7 December 2010); doi: 10.1117/12.882277
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211B (7 December 2010); doi: 10.1117/12.882258
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211C (7 December 2010); doi: 10.1117/12.881689
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211D (4 December 2010); doi: 10.1117/12.882301
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211E (7 December 2010); doi: 10.1117/12.882308
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211F (8 December 2010); doi: 10.1117/12.882407
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211G (8 December 2010); doi: 10.1117/12.882192
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211H (8 December 2010); doi: 10.1117/12.882388
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211I (7 December 2010); doi: 10.1117/12.882041
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211J (8 December 2010); doi: 10.1117/12.882045
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211K (8 December 2010); doi: 10.1117/12.882053
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211L (4 December 2010); doi: 10.1117/12.882263
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211M (4 December 2010); doi: 10.1117/12.882153
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211N (7 December 2010); doi: 10.1117/12.885003
Instruments, Sensors, and Microsystems
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211O (4 December 2010); doi: 10.1117/12.882294
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211P (8 December 2010); doi: 10.1117/12.882283
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211Q (4 December 2010); doi: 10.1117/12.882278
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211R (8 December 2010); doi: 10.1117/12.882287
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211S (7 December 2010); doi: 10.1117/12.882390
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211T (8 December 2010); doi: 10.1117/12.882520
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211U (8 December 2010); doi: 10.1117/12.882157
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211V (8 December 2010); doi: 10.1117/12.883461
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211W (4 December 2010); doi: 10.1117/12.882156
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211X (8 December 2010); doi: 10.1117/12.882365
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211Y (4 December 2010); doi: 10.1117/12.882374
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211Z (4 December 2010); doi: 10.1117/12.882371
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782120 (4 December 2010); doi: 10.1117/12.882312
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782121 (4 December 2010); doi: 10.1117/12.882351
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782122 (8 December 2010); doi: 10.1117/12.881723
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782123 (4 December 2010); doi: 10.1117/12.882282
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782124 (4 December 2010); doi: 10.1117/12.883298
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782125 (8 December 2010); doi: 10.1117/12.882819
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782126 (4 December 2010); doi: 10.1117/12.882398
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782127 (4 December 2010); doi: 10.1117/12.882269
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782128 (4 December 2010); doi: 10.1117/12.882040
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782129 (8 December 2010); doi: 10.1117/12.881904
Student Session
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212A (4 December 2010); doi: 10.1117/12.882274
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212B (4 December 2010); doi: 10.1117/12.883292
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212C (8 December 2010); doi: 10.1117/12.882507
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212D (4 December 2010); doi: 10.1117/12.882061
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212E (8 December 2010); doi: 10.1117/12.882162
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212F (7 December 2010); doi: 10.1117/12.881682
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212G (4 December 2010); doi: 10.1117/12.882215
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212H (4 December 2010); doi: 10.1117/12.882110
Additonal Paper
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78212I (4 December 2010); doi: 10.1117/12.882195
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