3 December 2010 Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials
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Proceedings Volume 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V; 782114 (2010) https://doi.org/10.1117/12.882140
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, 2010, Constanta, Romania
Abstract
Ellipsometry is a convenient means to ascertain electro-optic properties, and the null-type methods are particularly so because they do not require a powermeter. Electro-optic materials like Strontium Barium Niobate (SBN) with the symmetry axis normal or parallel to the surface are materials suitable for thin film integrated optic devices, therefore of practical interest. For this reason we endeavoured to devise and to test experimental arrangements that measure the birefringence of uniaxial structures with the symmetry axis parallel and perpendicular to the surface.
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Petre C. Logofatu, Petre C. Logofatu, Cristian Udrea, Cristian Udrea, Valentin Ion, Valentin Ion, Nicu Doinel Scărişoreanu, Nicu Doinel Scărişoreanu, Raluca Műller, Raluca Műller, } "Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials", Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782114 (3 December 2010); doi: 10.1117/12.882140; https://doi.org/10.1117/12.882140
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