Paper
7 December 2010 Main noise characteristics for MOS Hall plates
George Căruntu, Cornel Panait
Author Affiliations +
Proceedings Volume 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V; 78211X (2010) https://doi.org/10.1117/12.882365
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, 2010, Constanta, Romania
Abstract
In this paperwork based on the adequate models it is analysed the operating conditions, and are established the noise main characteristic for MOS Hall plates. By using the numerical simulation the values of the signal-to-noise ratio and the noise-equivalent magnetic induction for different structure devices are compared and it is also emphasized the way in which choosing the geometry and the material features allows getting high-performance sensors.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
George Căruntu and Cornel Panait "Main noise characteristics for MOS Hall plates", Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78211X (7 December 2010); https://doi.org/10.1117/12.882365
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KEYWORDS
Magnetism

Signal to noise ratio

Molybdenum

Magnetic sensors

Field effect transistors

Gallium arsenide

Resistance

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