Paper
24 September 2010 Cell projection use and multi column approach for throughput enhancement of EBDW system
Akio Yamada, Yoshihisa Ooae
Author Affiliations +
Abstract
The authors proposed a throughput enhancement of an e-beam direct writer by the combination of three key technologies; multi column cell, character projection, and high current density column technologies. They have finished proof-of-concept evaluations of multi column cell and character projection in the MASK-D2I project of ASET, including mix-and-match overlay results of better than 5nm. They found adequate conditions for the application of these three technologies to achieve the throughput above 5 wafers per hour in an e-beam direct writer.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Akio Yamada and Yoshihisa Ooae "Cell projection use and multi column approach for throughput enhancement of EBDW system", Proc. SPIE 7823, Photomask Technology 2010, 78231H (24 September 2010); https://doi.org/10.1117/12.868975
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconducting wafers

Beam shaping

Vestigial sideband modulation

Logic devices

Electron beam direct write lithography

Photomasks

Analog electronics

Back to Top