Self-mixing interference effect of VCSEL and the application on microdisplacement measurement

Hui Hao; Ming Wang; Dongmei Guo; Wei Xia

doi:10.1117/12.870599

12 November 2010 Self-mixing interference effect of VCSEL and the application on microdisplacement measurement

Hui Hao, Ming Wang, Dongmei Guo, Wei Xia

Proceedings Volume 7844, Semiconductor Lasers and Applications IV; 78440Y (2010) https://doi.org/10.1117/12.870599
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

The Self-Mixing Interference (SMI) effect of a Vertical-Cavity Surface-Emitting Laser (VCSEL) is studied in this paper. The analysis and experiment are presented to verify the dynamics of the VCSEL. The phenomenon is observed and contrasted with traditional interference phenomenon. The output property of VCSEL is modulated by the change of cavity length and feedback intensity. An interferometer using VCSEL self-mixing based on temporal carrier phase shifting technique is studied. Theoretical analysis and simulation calculations are presented and some errors of this method are discussed.

Citation Download Citation

Hui Hao, Ming Wang, Dongmei Guo, and Wei Xia "Self-mixing interference effect of VCSEL and the application on microdisplacement measurement", Proc. SPIE 7844, Semiconductor Lasers and Applications IV, 78440Y (12 November 2010); https://doi.org/10.1117/12.870599

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