Sensitivities of the spatial-resolved diffuse reflectance to scattering parameters

Xiao-juan Zhang; Wei Yang; Ying Liu

doi:10.1117/12.870927

8 November 2010 Sensitivities of the spatial-resolved diffuse reflectance to scattering parameters

Xiao-juan Zhang, Wei Yang, Ying Liu

Proceedings Volume 7845, Optics in Health Care and Biomedical Optics IV; 78452R (2010) https://doi.org/10.1117/12.870927
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

The sensitivity expressions of spatial-resolved diffuse reflectance to first-order, second-order and third-order scattering parameter are derived in the P₃ approximation of transport theory. The influence of first-order scattering parameter on the P₃ approximation and diffusion approximation reflectance are compared, it is demonstrated that the sensitivity is distinct with that of the diffusion approximation in the region of about two transport mean free paths. The numerical analysis of second-order and third-order scattering parameter sensitivity expressions are also done. It is found that the sensitivities change with source-detector separations and reach a maximum in the region of between one transport mean free path and two transport mean free paths, and are positive in the region of beyond one transport mean free path. The influence of third-order optical parameter on the diffusing reflectance can be ignored by compared with the influence of second-order optical parameter.

Citation Download Citation

Xiao-juan Zhang, Wei Yang, and Ying Liu "Sensitivities of the spatial-resolved diffuse reflectance to scattering parameters", Proc. SPIE 7845, Optics in Health Care and Biomedical Optics IV, 78452R (8 November 2010); https://doi.org/10.1117/12.870927

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