Paper
29 November 2010 Ferromagnetism in transparent thin film of Co-doped ZnO
Xueqiong Su, Li Wang, Jiangbo Chen, Xiaojing Wan, Le Kong
Author Affiliations +
Abstract
Transparent thin films are manufactured by PLD (pulsed laser deposition) in different oxygen pressure. The various property of samples is measured by Atomic Force Microscope (AFM), X-ray diffraction (XRD) and optical transmission spectrum. All samples retain the original structure in wurtzite lattice by XRD, there is not being of metallic cobalt or other impurity phase with the limit detection. The surface morphology of the films observes the smoother than that in undoped ZnO thin film. The transparency of thin films has altered greatly with the different oxygen pressure or not by PLD, which is shown that the oxygen pressure has impacted on the transparency of the film and surface morphology. And UV-visible spectra fully have been demonstrated the presence of Co2+ to substitute for Zn2+ in the films with the different oxygen pressure.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xueqiong Su, Li Wang, Jiangbo Chen, Xiaojing Wan, and Le Kong "Ferromagnetism in transparent thin film of Co-doped ZnO", Proc. SPIE 7847, Optoelectronic Devices and Integration III, 78471N (29 November 2010); https://doi.org/10.1117/12.868447
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Oxygen

Thin films

Zinc oxide

Cobalt

Crystals

Magnetic semiconductors

Ions

Back to Top