5 November 2010 Physics-based processing for terahertz reflection spectroscopy and imaging
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Proceedings Volume 7854, Infrared, Millimeter Wave, and Terahertz Technologies; 785403 (2010); doi: 10.1117/12.870664
Event: Photonics Asia 2010, 2010, Beijing, China
The spectra obtained from Terahertz (THz) reflection imaging can be distorted by scattering from rough interfaces, layers, and granular inclusions. Since the facets of the object being imaged are not generally aligned normal to the THz beam, the received signal is produced from diffuse scattering, which can be appreciably lower in signal strength than specular returns. These challenges can be addressed with advanced signal processing approaches based upon the coherent and incoherent combination of returns from multiple sensors and frequencies. This paper presents two examples of physics-based processing strategies applied to THz imaging spectroscopy. The first method is based on synthetic aperture processing of a 2D sensor array to provide variable depth focused images of buried inclusions (a ball bearing embedded in polyethylene sample). The second method uses correlation processing to coherently combine multiple sensors and multiple frequencies to extract material signatures from measurements of THz scattering from rough interfaces. Results for both methods show an increase in performance relative to conventional imaging or spectroscopy approaches.
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L. M. Zurk, S. C. Henry, S. Schecklman, D. D. Duncan, "Physics-based processing for terahertz reflection spectroscopy and imaging", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 785403 (5 November 2010); doi: 10.1117/12.870664; http://dx.doi.org/10.1117/12.870664

Terahertz radiation

Imaging spectroscopy




Reflectance spectroscopy

Terahertz spectroscopy

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