Paper
15 November 2010 Research on generated mechanism of scattering characteristic of random rough dielectric surface
Jiang Shu, Jiancheng Lai, Chunyong Wang, Zhenhua Li, Baomin Bian, Jian Lu
Author Affiliations +
Abstract
On the basis of electromagnetic theory, the scattering light intensity from a series of dielectric surfaces with different roughness is calculated by using monte-carlo method and the boundary condition of Kirchhoff approximation. The geometry profile of rough surfaces obeys Guass distribution and all of the surfaces have the same corelation length. With the increasing of rms height, the width of diffuse scattering intensity distribution, the attenuation of scattering peak value and its moving to the normal direction are observed. After theoretical analysis, it is obtained that the statistical distribution of the local slope varies with the rms height and reflecting index of these local slope are the main reasons for these phenomenon.
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Jiang Shu, Jiancheng Lai, Chunyong Wang, Zhenhua Li, Baomin Bian, and Jian Lu "Research on generated mechanism of scattering characteristic of random rough dielectric surface", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78540T (15 November 2010); https://doi.org/10.1117/12.870118
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KEYWORDS
Scattering

Light scattering

Reflectivity

Dielectrics

Laser scattering

Target detection

Electromagnetic scattering

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