Investigation of honeycomb structure using pulse infrared thermography method

Huijuan Li

doi:10.1117/12.869459

4 November 2010 Investigation of honeycomb structure using pulse infrared thermography method

Huijuan Li

Proceedings Volume 7854, Infrared, Millimeter Wave, and Terahertz Technologies; 78541G (2010) https://doi.org/10.1117/12.869459
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

To reduce weight and improve strength in the aerospace industry, composite structure has gained popularity as a replacement for conventional materials and structures, such as adhesive bonding and honeycomb structure. Honeycomb structures composed by a honeycomb core between two facesheets are very common on aerospace parts. However, the adhesive bonding process is more susceptible to quality variations during manufacturing than traditional joining methods. With the large increase in the use of composite materials and honeycomb structures, the need for high speed, large area inspection for fracture critical, sub-surface defects in aircraft, missiles and marine composites led to broad acceptance of infrared based NDT methods. Infrared thermography is one of several non-destructive testing techniques which can be used for defect detection in aircraft materials. Infrared thermography can be potentially useful, as it is quick, real time, non-contact and can examine over a relatively large area in one inspection procedure. In this paper, two kinds of defects which are of various size, shape and location below the test surface are planted in the honeycomb structure, they are all tested by pulsed thermography, analyze the thermal sequence and intensity graph got by this methods, it shows that pulsed thermography is an effective nondestructive technique for inspecting disbonding defect, can distinguish the location and the dimension of the defect exactly.

Citation Download Citation

Huijuan Li "Investigation of honeycomb structure using pulse infrared thermography method", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78541G (4 November 2010); https://doi.org/10.1117/12.869459

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available