Temperature measurement of contact resistance based on infrared detection

De En; Jieyu Feng

doi:10.1117/12.870064

4 November 2010 Temperature measurement of contact resistance based on infrared detection

De En, Jieyu Feng

Proceedings Volume 7854, Infrared, Millimeter Wave, and Terahertz Technologies; 785438 (2010) https://doi.org/10.1117/12.870064
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

For science and technology, the level of science and technology is determined by the measurement accuracy and efficiency to some extent. Contact resistance can not be ignored in precise measurement. Because the measured object is not directly contacted with infrared measurement device, there is no friction. Infrared measurement has the advantage of high sensitivity, fast response and so on. In this paper, the reasons for the temperature rising of the contact resistance and its harm and the importance of measuring the temperature of the contact resistance in precise measurement are analyzed firstly; then some theories of the infrared detection technology are introduced; finally, an infrared temperature measurement system based on SCM is designed.

Citation Download Citation

De En and Jieyu Feng "Temperature measurement of contact resistance based on infrared detection", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 785438 (4 November 2010); https://doi.org/10.1117/12.870064

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available