4 November 2010 Temperature measurement of contact resistance based on infrared detection
Author Affiliations +
Abstract
For science and technology, the level of science and technology is determined by the measurement accuracy and efficiency to some extent. Contact resistance can not be ignored in precise measurement. Because the measured object is not directly contacted with infrared measurement device, there is no friction. Infrared measurement has the advantage of high sensitivity, fast response and so on. In this paper, the reasons for the temperature rising of the contact resistance and its harm and the importance of measuring the temperature of the contact resistance in precise measurement are analyzed firstly; then some theories of the infrared detection technology are introduced; finally, an infrared temperature measurement system based on SCM is designed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
De En, De En, Jieyu Feng, Jieyu Feng, } "Temperature measurement of contact resistance based on infrared detection", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 785438 (4 November 2010); doi: 10.1117/12.870064; https://doi.org/10.1117/12.870064
PROCEEDINGS
8 PAGES


SHARE
Back to Top