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27 January 2011 Low cost characterization of TOF range sensors resolution
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Proceedings Volume 7864, Three-Dimensional Imaging, Interaction, and Measurement; 78640D (2011)
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States
The core of the paper is focused on the experimental characterization of four different 3D laser scanners based on Time of Flight principle, through the extraction of resolution, accuracy and uncertainty parameters from specifically designed 3D test objects. The testing process leads to four results: z-uncertainty, xy-resolution z-resolution and z-accuracy. The first is obtained by the evaluation of random residuals from the 3D capture of a planar target, the second from the scanner response to an abrupt z-jump, and the last two from direct evaluation of the image extracted by different geometric features progressively closer each other. The aim of this research is to suggest a low cost characterization process, mainly based on calibrated test object easy to duplicate, that allow an objective and reliable comparison between 3D TOF scanner performances.
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Gabriele Guidi, Michele Russo, Grazia Magrassi, and Monica Bordegoni "Low cost characterization of TOF range sensors resolution", Proc. SPIE 7864, Three-Dimensional Imaging, Interaction, and Measurement, 78640D (27 January 2011);

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