Translator Disclaimer
Paper
3 February 2011 Imaging using synchrotron radiation for forensic science
Author Affiliations +
Proceedings Volume 7870, Image Processing: Algorithms and Systems IX; 78700B (2011) https://doi.org/10.1117/12.876118
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States
Abstract
Forensic science is already taking benefits from synchrotron radiation (SR) sources in trace evidence analysis. In this contribution we show a multi-technique approach to study fingerprints from the morphological and chemical point of view using SR based techniques such as Fourier transform infrared microspectroscopy (FTIRMS), X-ray fluorescence (XRF), X-ray absorption structure (XAS), and phase contrast microradiography. Both uncontaminated and gunshot residue contaminated human fingerprints were deposited on lightly doped silicon wafers and on poly-ethylene-terephthalate foils. For the uncontaminated fingerprints an univariate approach of functional groups mapping to model FT-IRMS data was used to get the morphology and the organic compounds map. For the gunshot residue contaminated fingerprints, after a preliminary elemental analysis using XRF, microradiography just below and above the absorption edge of the elements of interest has been used to map the contaminants within the fingerprint. Finally, XAS allowed us to determine the chemical state of the different elements. The next step will be fusing the above information in order to produce an exhaustive and easily understandable evidence.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Cervelli, S. Carrato, A. Mattei, M. Jerian, L. Benevoli, L. Mancini, F. Zanini, L. Vaccari, A. Perucchi, and G. Aquilanti "Imaging using synchrotron radiation for forensic science", Proc. SPIE 7870, Image Processing: Algorithms and Systems IX, 78700B (3 February 2011); https://doi.org/10.1117/12.876118
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Laser-induced selective sublimation from silicates
Proceedings of SPIE (September 07 1994)
X-ray optics for nuclear inelastic scattering
Proceedings of SPIE (December 11 1997)
Potential application of doubly curved crystal optics
Proceedings of SPIE (November 03 2004)
X-ray supermirrors for BESSY-II
Proceedings of SPIE (September 25 1995)
Nondestructive analysis of artifacts
Proceedings of SPIE (March 16 2000)
Features of recording and calculating XEOL spectra
Proceedings of SPIE (June 09 2005)

Back to Top