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7 February 2011 Robust multifrequency inversion in terahertz diffraction tomography
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Proceedings Volume 7873, Computational Imaging IX; 78730P (2011)
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States
Multi-frequency terahertz imaging has received much attention in recent years due to its ability to observe unique spectral characteristics of chemicals, which can be used in numerous applications such as explosives detection. Short-pulse terahertz sources can provide broadband excitation, but current approaches for image formation based on diffraction tomography construct images independently for each frequency. This results in a lack of resolution at lower frequencies, and lower signal-to-noise reconstructions. In this paper, we explore different techniques for joint image formation using multiple frequencies for enhanced detection. Among these are techniques that use prior information on spectral characteristics of materials of interest to coherently combine information from multiple frequencies, as well as robust techniques that assume incomplete or inaccurate prior knowledge of spectral signatures. We explore the relative performance of these techniques on image reconstruction and object recognition tasks using numerical simulations.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ke Chen and David A. Castañón "Robust multifrequency inversion in terahertz diffraction tomography", Proc. SPIE 7873, Computational Imaging IX, 78730P (7 February 2011);


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