Statistical multi-resolution schemes for historical document binarization

Tayo Obafemi-Ajayi; Gady Agam

doi:10.1117/12.876582

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24 January 2011 Statistical multi-resolution schemes for historical document binarization

Tayo Obafemi-Ajayi, Gady Agam

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Proceedings Volume 7874, Document Recognition and Retrieval XVIII; 78740S (2011) https://doi.org/10.1117/12.876582
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States

Abstract

In previous work , we proposed the application of the Expectation-Maximization (EM) algorithm in the binarization of historical documents by defining a multi-resolution framework. In this work, we extend the multiresolution framework to the Otsu algorithm for effective binarization of historical documents. We compare the effectiveness of the EM based binarization technique to the Otsu thresholding algorithm on historical documents. We demonstrate how the EM can be extended to perform an effective segmentation of historical documents by taking into account multiple features beyond the intensity of the document image. Experimental results, analysis and comparisons to known techniques are presented using the document image collection from the DIBCO 2009 contest.

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Tayo Obafemi-Ajayi and Gady Agam "Statistical multi-resolution schemes for historical document binarization", Proc. SPIE 7874, Document Recognition and Retrieval XVIII, 78740S (24 January 2011); https://doi.org/10.1117/12.876582

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