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23 February 2011 Reducing noise in extended depth of field microscope images by optical manipulation of the point spread function
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Abstract
This work describes improved methods and algorithms for implementing extended depth of field (EDF) microscopy through point spread function (PSF) engineering. It utilizes adaptive optics to create a test bed on which to evaluate new phase shapes for EDF. Being able to quickly and cheaply design novel PSFs is essential to overcome limitations of EDF that have prevented the technology from reaching mainstream use. Further improvement is made by reducing the noise normally seen in EDF images. Computational optics principles are used to first encode the noise with an identifiable pattern and a specially-tailored non-linear algorithm then removes the noise. This approach improves a microscope's imaging capabilities in photon-starved applications such as live-cell fluorescence and object tracking.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ramzi N. Zahreddine, Robert H. Cormack, and Carol J. Cogswell "Reducing noise in extended depth of field microscope images by optical manipulation of the point spread function", Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79041E (23 February 2011); https://doi.org/10.1117/12.881296
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