High-precision three-dimensional position measurement of particles by digital Gabor holography

Myung K. Kim; Mariana C. Potcoava; Leo G. Krzewina

doi:10.1117/12.876249

11 February 2011 High-precision three-dimensional position measurement of particles by digital Gabor holography

Myung K. Kim, Mariana C. Potcoava, Leo G. Krzewina

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Proceedings Volume 7908, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications VIII; 790806 (2011) https://doi.org/10.1117/12.876249
Event: SPIE BiOS, 2011, San Francisco, California, United States

Abstract

A single exposure of digital Gabor holography (DGH) is used for simultaneous three-dimensional measurement of particle position. The particle sample is set up such that its position can be electro-mechanically manipulated using calibrated piezoelectric transducers in both the lateral and axial directions. The central position of the reconstructed image of the particle is determined by low-pass filtering, thresholding, and center-of-mass calculation. We have obtained less than 20 nm resolution in both the lateral and axial directions in a direct and unambiguous manner. The method is applied to calibration of optical trap strength.

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Myung K. Kim, Mariana C. Potcoava, and Leo G. Krzewina "High-precision three-dimensional position measurement of particles by digital Gabor holography", Proc. SPIE 7908, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications VIII, 790806 (11 February 2011); https://doi.org/10.1117/12.876249

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KEYWORDS

Particles

Ferroelectric materials

Holography

Digital holography

3D metrology

3D image reconstruction

Optical tweezers

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