21 February 2011 Optimized biasing of pump laser diodes in a highly reliable metrology source for long-duration space missions
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Abstract
Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.
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Ilya Y. Poberezhskiy, Daniel H. Chang, Hernan Erlig, "Optimized biasing of pump laser diodes in a highly reliable metrology source for long-duration space missions", Proc. SPIE 7918, High-Power Diode Laser Technology and Applications IX, 791807 (21 February 2011); doi: 10.1117/12.877605; https://doi.org/10.1117/12.877605
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