14 February 2011 Sensorless adaptive optics for microscopy
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Proceedings Volume 7931, MEMS Adaptive Optics V; 79310G (2011) https://doi.org/10.1117/12.875286
Event: SPIE MOEMS-MEMS, 2011, San Francisco, California, United States
Abstract
Most implementations of adaptive optics in microscopes have not employed a wavefront sensor, but have instead used sensorless aberration correction methods. In these systems, the aberration is determined indirectly through the optimisation of a quality metric, such as image intensity. We explain the principles behind this approach and show how efficient correction schemes can be developed using suitable mathematical models. In particular, we explain how the correct choice of aberration expansion enables the independent measurement of each aberration mode via a simple quadratic maximisation.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Jesacher, Alexander Jesacher, Martin J. Booth, Martin J. Booth, } "Sensorless adaptive optics for microscopy", Proc. SPIE 7931, MEMS Adaptive Optics V, 79310G (14 February 2011); doi: 10.1117/12.875286; https://doi.org/10.1117/12.875286
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