11 February 2011 Spectral transmittance and reflectance measurements utilizing a DLP based spectral source
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Proceedings Volume 7932, Emerging Digital Micromirror Device Based Systems and Applications III; 79320J (2011); doi: 10.1117/12.877087
Event: SPIE MOEMS-MEMS, 2011, San Francisco, California, United States
Abstract
Spectral transmission and reflectance are critical parameters for the evaluation of pigments, textiles and coatings on a number of product surfaces, including active displays. In this paper, we evaluate the usage of a DLP®- based spectral source as a tool in such observations noting its advantages not only in synthesizing individual band-passes but also full continua present in nature. We discuss how such capabilities are advantages for determining product effectiveness in conditions of real world usage as well as its limitations and future objectives.
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Alexandre Y. Fong, "Spectral transmittance and reflectance measurements utilizing a DLP based spectral source", Proc. SPIE 7932, Emerging Digital Micromirror Device Based Systems and Applications III, 79320J (11 February 2011); doi: 10.1117/12.877087; http://dx.doi.org/10.1117/12.877087
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KEYWORDS
Reflectivity

Transmittance

Diffuse reflectance spectroscopy

Translucency

Optical filters

Sensors

Light sources

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