Modeling of afterpulsing in single-photon avalanche diodes

Michele Anti; Alberto Tosi; Fabio Acerbi; Franco Zappa

doi:10.1117/12.875143

21 February 2011 Modeling of afterpulsing in single-photon avalanche diodes

Michele Anti, Alberto Tosi, Fabio Acerbi, Franco Zappa

Proceedings Volume 7933, Physics and Simulation of Optoelectronic Devices XIX; 79331R (2011) https://doi.org/10.1117/12.875143
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

The afterpulsing noise in Single-Photon Avalanche Diodes (SPADs) is modeled and investigated in order to evaluate its impact on SPAD performance, in terms of maximum count rate, signal-to-noise ratio, etc. From measurements fitting, we identified three/four types of defects that we then used to simulate the behavior of the SPAD when operated in different conditions. We show how the presented modeling is a valuable tool for the estimation of the performance of different SPADs and the identification of optimal operating conditions, in terms of temperature, voltage bias, gate width, gate repetition frequency, quenching time, etc.

Citation Download Citation

Michele Anti, Alberto Tosi, Fabio Acerbi, and Franco Zappa "Modeling of afterpulsing in single-photon avalanche diodes", Proc. SPIE 7933, Physics and Simulation of Optoelectronic Devices XIX, 79331R (21 February 2011); https://doi.org/10.1117/12.875143

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