Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams

Mark E. Siemens; Qing Li; Ronggui Yang; Keith A. Nelson; Erik H. Anderson; Margaret M. Murnane; Henry C. Kapteyn

doi:10.1117/12.871455

21 February 2011 Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams

Mark E. Siemens, Qing Li, Ronggui Yang, Keith A. Nelson, Erik H. Anderson, Margaret M. Murnane, Henry C. Kapteyn

Author Affiliations +

Proceedings Volume 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV; 793716 (2011) https://doi.org/10.1117/12.871455
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

Heat dissipation from a nanoscale hot-spot is expected to be non-diffusive when a hot-spot is smaller than the phonon mean free path of the substrate. Our technique of observing diffraction of coherent soft x-ray pulses allows for very high resolution (~pm) of thermally-induced surface distortion, as well as femtosecond time resolution of dynamics. We successfully model our experimental results with a diffusive transport model that is modified to include an additional boundary resistance. These results confirm the importance of considering ballistic transport away from a nanoscale heat source, and identify a means of correctly accounting for this ballistic transport.

Citation Download Citation

Mark E. Siemens, Qing Li, Ronggui Yang, Keith A. Nelson, Erik H. Anderson, Margaret M. Murnane, and Henry C. Kapteyn "Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams", Proc. SPIE 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV, 793716 (21 February 2011); https://doi.org/10.1117/12.871455

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