Nonlinear Transmission Of Semiconductor Thin Films

E. W. Van Stryland; Steven A. Miller; B. S. Wherrett

doi:10.1117/12.940923

22 April 1987 Nonlinear Transmission Of Semiconductor Thin Films

E. W. Van Stryland, Steven A. Miller, B. S. Wherrett

Proceedings Volume 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices; (1987) https://doi.org/10.1117/12.940923
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

We observe two-photon absorption (2PA) of picosecond, 0.6 μm, 0.25 nJ pulses in a 0.4 μm film of ZnSe. We use high-frequency modulation phase- sensitive detection to be near the shot noise limit, followed by a low frequency pulse delay modulation to discriminate against large thermal nonlinearities. This dual modulation technique, combined with the field enhancement produced by placing the film in a resonant cavity, allows observation of 2PA and other fast nonlinearities using pulses having peak powers of the order of a Watt.

Citation Download Citation

E. W. Van Stryland, Steven A. Miller, and B. S. Wherrett "Nonlinear Transmission Of Semiconductor Thin Films", Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); https://doi.org/10.1117/12.940923

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