14 March 2011 Radiation damage formation and annealing in GaN and ZnO
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Proceedings Volume 7940, Oxide-based Materials and Devices II; 79400O (2011) https://doi.org/10.1117/12.879402
Event: SPIE OPTO, 2011, San Francisco, California, United States
The radiation damage formation upon low temperature ion implantation and neutron irradiation has been compared for GaN and ZnO. Both materials exhibit strong dynamic annealing effects during implantation, even at 15 K, leading to high amorphisation thresholds. The damage build-up with fluence was found to proceed in a similar way for GaN and ZnO, both showing two saturation regimes below the amorphisation level where, over wide fluence regions, the damage level increases only very slowly. For low fluences the damage accumulation rate is similar for both materials. For higher fluences, on the other hand, GaN shows considerably higher damage levels and finally collapses into an amorphous structure while ZnO remains single crystalline up to the highest fluence of 7×1016 Ar/cm2. Neutron irradiation produces similar defects as ion implantation but within the entire sample while the defect density is much lower. The main effect of irradiation on the structural properties of GaN is an expansion of the c-lattice parameter. Optical properties are significantly deteriorated after irradiation and only recover partially after annealing. ZnO does not suffer such a pronounced change of the lattice parameters but reveals a strong deterioration of the surface, possibly due to blistering and exfoliation. At the same time the optical properties are less affected than for GaN. The near band edge emission is partly quenched but recovers to a large extend after annealing while broad defect bands are observed below the bandgap for irradiated samples, before and after annealing.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Lorenz, K. Lorenz, M. Peres, M. Peres, N. Franco, N. Franco, J. G. Marques, J. G. Marques, S. M. C. Miranda, S. M. C. Miranda, S. Magalhães, S. Magalhães, T. Monteiro, T. Monteiro, W. Wesch, W. Wesch, E. Alves, E. Alves, E. Wendler, E. Wendler, } "Radiation damage formation and annealing in GaN and ZnO", Proc. SPIE 7940, Oxide-based Materials and Devices II, 79400O (14 March 2011); doi: 10.1117/12.879402; https://doi.org/10.1117/12.879402

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