24 January 2011 Process analytical applications in the mid-infrared
Author Affiliations +
Proceedings Volume 7945, Quantum Sensing and Nanophotonic Devices VIII; 79450N (2011); doi: 10.1117/12.871571
Event: SPIE OPTO, 2011, San Francisco, California, United States
Abstract
A review of applications for tunable diode laser spectroscopy (TDLS) instrumentation in process analytics is presented. We have investigated applications in olefin production suitable for TDLS instrumentation. The possibility to detect acetylene impurities in different hydrocarbon backgrounds was investigated by TDLS in the 3 micron wavelength region using novel GaInAsSb/AlGaAsSb DFB lasers. The performance of the TDLS instrument for detection of acetylene impurities in pure ethylene and in a gas matrix typical of a hydrogenating reactor was investigated more in detail. Experiments with in-situ measurements of hydrocarbons in an industrial environment using a modified Siemens TDLS instrument are also discussed.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Lundqvist, P. Kluczynski, "Process analytical applications in the mid-infrared", Proc. SPIE 7945, Quantum Sensing and Nanophotonic Devices VIII, 79450N (24 January 2011); doi: 10.1117/12.871571; https://doi.org/10.1117/12.871571
PROCEEDINGS
10 PAGES


SHARE
KEYWORDS
Laser development

Analytics

Gases

Absorption

Manufacturing

Mid-IR

Sensors

Back to Top