Testing Monolithic GaAs MMIC Circuits

Allen Podell; Doug Lockie

doi:10.1117/12.940965

2 February 1988 Testing Monolithic GaAs MMIC Circuits

Allen Podell, Doug Lockie

Proceedings Volume 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits; (1988) https://doi.org/10.1117/12.940965
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

Testing microwave circuits is difficult because of the pronounced effects of stray capacitance and inductance, and because of the problems caused by electromagnetic energy reflected from circuit impedance discontinuities (VSW effects). Monolithic Microwave Integrated Circuits (MMICs) present additional problems of a semiconductor implementation nature.

Citation Download Citation

Allen Podell and Doug Lockie "Testing Monolithic GaAs MMIC Circuits", Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); https://doi.org/10.1117/12.940965

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