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8 February 2011 Sensitive thermal reflectance measurement for laser cooling applications
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Proceedings Volume 7951, Laser Refrigeration of Solids IV; 79510J (2011) https://doi.org/10.1117/12.879137
Event: SPIE OPTO, 2011, San Francisco, California, United States
Abstract
We demonstrate application of the thermal reflectance measurement in a balanced detector arrangement to resolve laser induced temperature shifts in ytterbium-doped yttrium-lithium-fluoride (Yb:YLF) during optical refrigeration experiments. Definite signature of cooling versus heating allows for rapid screening of the performance of the laser cooling material.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Ghasemkhani, D. Seletskiy, and M. Sheik-Bahae "Sensitive thermal reflectance measurement for laser cooling applications", Proc. SPIE 7951, Laser Refrigeration of Solids IV, 79510J (8 February 2011); https://doi.org/10.1117/12.879137
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