Paper
16 February 2011 Gain characteristics of deep UV AlGaN quantum wells lasers
Jing Zhang, Hongping Zhao, Nelson Tansu
Author Affiliations +
Proceedings Volume 7953, Novel In-Plane Semiconductor Lasers X; 79530H (2011) https://doi.org/10.1117/12.875079
Event: SPIE OPTO, 2011, San Francisco, California, United States
Abstract
The optical gain characteristics of high Al-content AlGaN quantum wells (QWs) are analyzed for deep UV lasers. The effect of crystal-field split-off hole (CH) and heavy-hole (HH) bands crossover on the gain characteristics of AlGaN QW with AlN barriers is analyzed. Attributing to the strong transition between conduction - CH bands, the TM spontaneous emission recombination rate is enhanced significantly for high Al-content AlGaN QWs. Large TM-polarized material gain is shown as achievable for high Al-content AlGaN QWs, which indicates the feasibility of TM lasing for lasers emitting at ~220-230 nm.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jing Zhang, Hongping Zhao, and Nelson Tansu "Gain characteristics of deep UV AlGaN quantum wells lasers", Proc. SPIE 7953, Novel In-Plane Semiconductor Lasers X, 79530H (16 February 2011); https://doi.org/10.1117/12.875079
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KEYWORDS
Quantum wells

Aluminum nitride

Deep ultraviolet

UV optics

Laser optics

Light emitting diodes

Polarization

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