Paper
16 March 2011 Performance characterization of a silicon strip detector for spectral computed tomography utilizing a laser testing system
Cheng Xu, Mats Danielsson, Staffan Karlsson, Christer Svensson, Hans Bornefalk
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Abstract
A new silicon strip detector with sub-millimeter pixel size operated in single photon-counting mode has been developed for use in spectral computed tomography (CT). An ultra fast application specific integrated circuit (ASIC) specially designed for fast photon-counting application is used to process the pulses and sort them into eight energy bins. This report characterizes the ASIC and detector in terms of thermal noise (0.77 keV RMS), energy resolution when electron-hole pairs are generated in the detector diode (1.5 keV RMS) and Poissonian count rate with retained count rate linearity and energy resolution (200 Mcps•mm-2). The performance of the photon-counting detector has been tested using a picosecond pulsed laser system to inject energy into the detector, simulating x-ray interactions. The laser testing results indicate a good energy-discriminating capability of the detector, assigning the pulses to higher and higher energy bins as the intensity of the laser pulses are increased.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cheng Xu, Mats Danielsson, Staffan Karlsson, Christer Svensson, and Hans Bornefalk "Performance characterization of a silicon strip detector for spectral computed tomography utilizing a laser testing system", Proc. SPIE 7961, Medical Imaging 2011: Physics of Medical Imaging, 79610S (16 March 2011); https://doi.org/10.1117/12.872867
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Cited by 14 scholarly publications.
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KEYWORDS
Sensors

Diodes

Silicon

Semiconductor lasers

Microchannel plates

Pulse generators

Laser systems engineering

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