4 April 2011 Partial least squares-preconditioned importance sampling for fast circuit yield estimation
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Abstract
We propose a partial least squares (PLS)-preconditioned importance sampling method for yield estimation. The method makes use of the rotating vector obtained through PLS regression, and finds the boundary point along the vector by line search. A biased distribution is constructed around that point for subsequent importance sampling simulation. This method is shown to be much more stable and efficient than existing approaches and is validated via an SRAM example.
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Yu Ben, Yu Ben, Costas J. Spanos, Costas J. Spanos, } "Partial least squares-preconditioned importance sampling for fast circuit yield estimation", Proc. SPIE 7974, Design for Manufacturability through Design-Process Integration V, 79740P (4 April 2011); doi: 10.1117/12.878725; https://doi.org/10.1117/12.878725
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